Wednesday - April 23, 2025

Bidirectional Littrow Two-Degree-of-Freedom Grating Interference Measurement Device Based on Double Gratings

2025-03-04

ALEXANDRIA, Virginia, March 4 -- CHANGCHUN INSTITUTE OF OPTICS, FINE MECHANICS AND PHYSICS, CHINESE ACADEMY OF SCIENCES, Changchun, China has been assigned a patent (No. US 12241739 B1, initially filed Sept. 25, 2024) developed by five inventors Wenhao Li, Changchun, China; Wenyuan Zhou, Changchun, China; Zhaowu Liu, Changchun, China; Yujia Sun, Changchun, China; and Lin Liu, Changchun, China, for "Bidirectional Littrow two-degree-of-freedom grating interference measurement device based on doub . . .

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Bidirectional Littrow Two-Degree-of-Freedom Grating Interference Measurement Device Based on Double Gratings

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