Researchers at NYU Tandon and KAIST Develop Method to 'hear' Defects in Promising Nano Material
October 23, 2024
October 23, 2024
BROOKLYN, New York, Oct. 23 (TNSres) -- New York University Tandon School of Engineering issued the following news release:
An international research team led by NYU Tandon School of Engineering and KAIST (Korea Advanced Institute of Science and Technology) has pioneered a new technique to identify and characterize atomic-scale defects in hexagonal boron nitride (hBN), a two-dimensional (2D) material often dubbed "white graphene" for its remarkable properties.
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An international research team led by NYU Tandon School of Engineering and KAIST (Korea Advanced Institute of Science and Technology) has pioneered a new technique to identify and characterize atomic-scale defects in hexagonal boron nitride (hBN), a two-dimensional (2D) material often dubbed "white graphene" for its remarkable properties.
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